Manjul Bhushan: Selected publications

1. Bhushan M, Ketchen MB (2010) Generation, elimination and utilization of harmonics in ring oscillators. Proceedings of the 2010 IEEE international conference on microelectronic test structures, 2010, pp 108-113

2.Ketchen MB, Bhushan M, Costrini G (2009) Addressable arrays implemented with one metal level for MOSFET and resistor variability characterization. Proceedings of the 2009 IEEE international conference on microelectronic test structures, 2009, pp 13-18

3. Bhushan M, Ketchen MB, Das KK (2008) CMOS latch metastability characterization at the 65-nm-technology node. Proceedings of the 2008 IEEE international conference on microelectronic test structures, 2008, pp 147-151

4. Bhushan M, Ketchen MB, Cai M, Kim C, (2008) Ring oscillator technique for MOSFET CV characterization. IEEE Trans Semicond Manuf 21:180-185

5. Das KK, Walker SG, Bhushan M (2007) An integrated CAD methodology for evaluating MOSFET and parasitic extraction models and variability. Proceedings of the IEEE 95:670-687

6. Ketchen MB, Bhushan M, Bolam R (2007) Ring oscillator based test structure for NBTI analysis. Proceedings of the 2007 IEEE international conference on microelectronic test structures, 2007, pp 43-47

7. Ketchen MB, Xiu K, Bhushan M (2007) Measurement of thermal time constant in 65-nm PD-SOI technology with sub-ns resolution. Proceedings of the 2007 IEEE international SOI conference, 2007, pp 53-54

8. Nitta S, Ponoth S, Breyta G, Colburn M, Clevenger L, Horak D, Bhushan M, Casey J, Chan E, Cohen S, Colt, Jr., P. Flaitz, E. Fluhr, N. Fuller, A. Kniffin, E. Huang, K. Kumar, H. Landis, B. Li, W-K. Li, E. Liniger, A. Lisi, X. Liu J, Lloyd JR, Melville I, Muncy J, Nogami T, Ramachandran V, Rath DL, Standaert T, Sucharitaves J-T, Turnbull D, Crabbe E, McCredie B, Lane M, Purushothaman S, Edelstein D(2007) A Multilevel Copper/Low-k/Airgap BEOL Technology. Advanced metallization conference, 2007

9. Gattiker A, Bhushan M, Ketchen MB (2006) Data analysis techniques for CMOS characterization and product impact assessment. IEEE international test conference ITC'06, L3.3

10. Ketchen MB, Bhushan M (2006) Product representative 'at speed' test structures for CMOS characterization. IBM J Res Dev 50: 451-468

11. Bhushan M, Ketchen MB, Polonsky S, Gattiker A (2006) Ring oscillator technique for measuring variability statistics. Proceedings of the 2006 IEEE international conference on microelectronic test structures, 2006, pp 87-93
Best paper award

12. Polonsky S, Bhushan M, Gattiker A, Weger A, Song P (2005) Photon emission microscopy of inter/intra chip device performance variations. Microelectronics Reliability 45:1471-1475

13. Ketchen M, Bhushan M, Pearson DJ (2005) High speed test structures for in-line process monitoring and model calibration. Proceedings of the 2005 IEEE international conference on microelectronic test structures, 2005, pp 33-38
Best paper award

14. Ketchen MB, Bhushan M, Anderson CJ (2004) Circuit and technique for characterizing switching delay history effects in silicon-on-insulator logic gates. Rev Sci Instrum 75:768-771

15. Ketchen MB, Kirtley JR, Bhushan M (1997) Miniature vector magnetometer for scanning SQUID microscopy, IEEE Trans Appl Supercond 7:3139-3142

16. Paul BI, Oliva A, Semenov VK, Bhushan M, Likharev KK, Lukens JE, Ketchen MB Mallison WH (1995) High-speed single flux-quantum-circuit using planarized niobium-trilayer Josephson technology. Appl Phys Lett 66:646-648

17. Bhushan M, Rouse R, Lukens JE (1995) Chemical-mechanical polishing in semidirect contact mode. J Electrochem Soc 142:3845-3851

18. Bao Z, Bhushan M, Han S, Lukens JE (1995) Fabrication of high quality deep sub-micron Nb/AlOx/Nb Josephson junctions using chemical mechanical polishing. IEEE Trans Appl Supercond 5:2731-2734

19. Ketchen MB, Pearson D, Kleinsasser AW, Hu C-K, Smyth M, Logan J, Stawiasz K, Baran E, Jaso M, Ross T, Petrillo K, Manny M, Basavaiah S, Brodsky S, Kaplan SB, Gallagher WJ, Bhushan M (1991) Sub-micron, planarized, Nb-AlOx-Nb Josephson junction process for 125 mm wafers developed in partnership with Si technology. Appl Phys Lett 59:2609-2611

20. Bhushan M, Macedo E (1991) Nb/A1Ox/Nb trilayer process for the fabrication of sub-micron Josephson junctions and low-noise dc SQUIDs. Appl Phys Lett 58:1323-1325

21. Green JB, Bhushan M (1991) Analog signal correlator design and operation. IEEE Trans Magnetics 27:3380-3383

22. Bhushan M, Green JB, Anderson AC (1989) Low-loss lumped-element capacitors for superconductive integrated circuits. IEEE Trans Magnetics 25:1143-1446

23. Bhushan M, Strauss AJ (1989) Sequential Ar-O2 sputtering of Y2O3, BaF2 and CuO targets for preparation of Y-Ba-Cu-O superconducting films without wet-O2 annealing. Appl Phys Lett 55:2438-2440

24. Bhushan M, Cantor R, Gordon J, Goldman A, Yu F (1987) The superconducting transition in a million Josephson element SNAP array. IEEE Trans Magnetics 23:1122-1125

25. Bhushan M (1987) Analysis of reactive sputtering mechanisms for NbN thin film deposition. J Vac Sci & Technol A5:2829-2835

26. Bhushan M (1983) Mg diffused zinc phosphide n/p junctions. J Appl Phys 53:514-519

27. Bhushan M, Powlikowski JM, Pereyra I (1982) Zinc phosphide for solar cell applications. Proceedings Electrochem Soc 82:505-513

28. Bhushan M, Catalano AW (1981) Polycrystalline Zn3P2 Schottky barrier solar cells. Appl Phys Lett 38:39-41

29. Sherrill MD, Bhushan M (1979) Cylindrical Josephson tunneling. Phys Rev 19:1463-1469